Recent Advances in Logo Detection Using Machine Learning Paradigms
Theory and Practice
Edición de la obra Recent Advances in Logo Detection Using Machine Learning Paradigms
| Autor | Yen-Wei Chen, Xiang Ruan, Rahul Kumar Jain |
|---|---|
| Editorial | Springer International Publishing AG |
| Fecha de publicación | 2024 |
| Idioma | inglés |
| ISBN-13 | 9783031598104 |
| Número de Cutter | C518r |