Pattern recognition, chemometrics, and imaging for optical environmental monitoring
20-21 September, 1999, Boston, Massachusetts
Edición de la obra Pattern recognition, chemometrics, and imaging for optical environmental monitoring
| Autor | D. Eastwood |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 1999 |
| Lugar | Bellingham, Washington |
| Idioma | inglés |
| Páginas | 142 |
| ISBN-10 | 0819434477 |
| OCLC | 43299812 |
| LCCN | 00711256 |
| Serie | SPIE proceedings series ; · 3854 · Proceedings of SPIE--the International Society for Optical Engineering ; |