P-polarized reflectance spectroscopy
a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
Edición de la obra P-polarized reflectance spectroscopy
| Autor | Nikolaus Dietz |
|---|---|
| Editorial | National Aeronautics and Space Administration, National Technical Information Service, distributor |
| Fecha de publicación | 1995 |
| Lugar | [Washington, D.C, Springfield, Va |
| Idioma | inglés |
| Formato | Microform |
| Serie | NASA contractor report -- NASA CR-199715. |
| Número de Cutter | D566p |