Optical system contamination
effects, measurements, and control VII : 9-11 July 2002, Seattle, [Washington] USA
Edición de la obra Optical system contamination
| Autor | SPIE, Boeing Company |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 2002 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 282 |
| ISBN-10 | 081944541X |
| OCLC | 50750026 |
| LCCN | 2003265125 |
| Serie | Proceedings / SPIE--the International Society for Optical Engineering ; · v. 4774 · Proceedings of SPIE--the International Society for Optical Engineering ; |