Optical characterization techniques for semiconductor technology
April 1-2, 1981, San Jose, California
Edición de la obra Optical characterization techniques for semiconductor technology
| Autor | Roy F. Potter |
|---|---|
| Editorial | Society of Photo-optical Instrumentation Engineers |
| Fecha de publicación | 1981 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 262 |
| ISBN-10 | 0892523093 |
| OCLC | 7472758 |
| LCCN | 81051404 |
| Serie | Proceedings of the Society of Photo-optical Instrumentation Engineers ; · v. 276 |