Measurement and Materials Characterization
Edición de la obra Microwave electronics
| Autor | L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay Varadan |
|---|---|
| Editorial | Wiley |
| Fecha de publicación | April 30, 2004 |
| Idioma | inglés |
| Páginas | 552 |
| ISBN-13 | 9780470844922 |
| ISBN-10 | 0470844922 |
| Número de Cutter |
|---|
C518m |
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and applications. Presents materials property characterisation methods along with a discussion of the underlying theory. Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defenc...