Número de Cutter-SanbornM186mEntrada «Maes» → 186 · marca de obra “m”

Materials, technology and reliability for advanced interconnects and low-k dielectrics

Name: Materials, technology and reliability for advanced interconnects and low-k dielectrics
ISBN: 155899520X

symposium held April 23-27, 2000, San Fransico, California, U.S.A.

Número de Cutter
Autor	Karen Maex
Editorial	Materials Research Society
Fecha de publicación	2001
Lugar	Warrendale, Pa
Idioma	inglés
ISBN-10	155899520X
OCLC	47222899
LCCN	00069552
Serie	Materials Research Society symposium proceedings -- v. 612 · Materials Research Society symposia proceedings -- v. 612.

Materials, technology and reliability for advanced interconnects and low-k dielectrics (20 | Cutter Number