Ion bombardment induced compositional changes in compound semiconductor surfaces studied by XPS combined with LEISS.
Edición de la obra Ion bombardment induced compositional changes in compound semiconductor surfaces studied by XPS combined with LEISS
| Autor | Wei Yu |
|---|---|
| Editorial | Aston University. Department of Electronic Engineering and Applied Physics |
| Fecha de publicación | 1995 |
| Lugar | Birmingham |
| Idioma | inglés |
| Número de Cutter | Y94i |