Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Edición de la obra Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
| Autor | Peter Pichler |
|---|---|
| Editorial | Springer |
| Fecha de publicación | July 20, 2004 |
| Idioma | inglés |
| Páginas | 554 |
| Formato |