Interferometry--surface characterization and testing
24 July 1992, San Diego, California
Edición de la obra Interferometry--surface characterization and testing
| Autor | Katherine Creath, John E. Greivenkamp |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 1992 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 183 |
| ISBN-10 | 0819409499 |
| OCLC | 27255547 |
| LCCN | 92085390 |
| Serie | Proceedings / SPIE--the International Society for Optical Engineering ; · v. 1776 · Proceedings of SPIE--the International Society for Optical Engineering ; |