Interfacial Compatibility In Microelectronics Moving Away From The Trial And Error Approach Tomi Laurila Et Al
Edición de la obra Interfacial Compatibility In Microelectronics Moving Away From The Trial And Error Approach Tomi Laurila Et Al
| Autor | Tomi Laurila |
|---|---|
| Editorial | Springer |
| Fecha de publicación | 2012 |
| ISBN-13 | 9781447124696 |
| Número de Cutter | L385i |