IEEE conference record
papers presented at the symposium
Edición de la obra IEEE conference record
| Autor | Institute of Electrical and Electronics Engineers, Argonne National Laboratory, Symposium on Feature Extraction and Selection in Pattern Recognition (1970 Argonne National Laboratory) |
|---|---|
| Editorial | Institute of Electrical and Electronics Engineers |
| Fecha de publicación | 1970 |
| Lugar | New York |
| Idioma | inglés |
| Páginas | 258 |
| OCLC | 9937429 |
| Serie | 70 C 51-C |