Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2
Edición de la obra Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2
| Autor | J. C. Marshall |
|---|---|
| Editorial | U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology |
| Fecha de publicación | 1992 |
| Lugar | Gaithersburg, MD |
| Idioma | inglés |
| Páginas | 140 |
| Formato | Microform |
| ISBN-10 | 0160367883 |
| OCLC | 27018099 |
| Serie | Semiconductor measurement technology · NIST special publication -- 400-90. |
| Número de Cutter |