Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2
Edición de la obra Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2
| Autor | J. C. Marshall |
|---|---|
| Editorial | U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O. |
| Fecha de publicación | 1992 |
| Lugar | Gaithersburg, MD, Washington, DC |
| Idioma | inglés |
| Páginas | 140 |
| LCCN | 93109203 |
| Serie | Semiconductor measurement technology · NIST special publication ; · 400-90 |
| Número de Cutter | M368e |