Electrically based microstructural characterization II
symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
Edición de la obra Electrically based microstructural characterization II
| Autor | Mohammed A. Alim, S. Ray Taylor, Rosario A. Gerhardt |
|---|---|
| Editorial | Materials Research Society |
| Fecha de publicación | 1998 |
| Lugar | Warrendale, Pa |
| Idioma | inglés |
| Páginas | 367 |
| ISBN-10 | 155899405X |
| OCLC | 39951763 |
| LCCN |