Distributed testing of a device-level interface specification for a metrology system
Edición de la obra Distributed testing of a device-level interface specification for a metrology system
| Autor | John Horst |
|---|---|
| Editorial | U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology |
| Fecha de publicación | 2002 |
| Lugar | Gaithersburg, MD |
| Idioma | inglés |
| Páginas | 19 |
| Formato | Microform |
| OCLC | 50263005 |
| Serie | NISTIR -- 6851 |
| Número de Cutter | H819d |