Design and test technology for dependable systems-on-chip
Edición de la obra Design and test technology for dependable systems-on-chip
| Autor | Raimund Ubar |
|---|---|
| Editorial | Information Science Reference |
| Fecha de publicación | 2010 |
| Lugar | Hershey, PA |
| Idioma | inglés |
| Páginas | 550 |
| ISBN-13 | 9781609602123, 9781609602147 |
| LCCN | 2010045850 |
| Número de Cutter | U12d |
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--