CMOS gate-stack scaling-- materials, interfaces and reliability implications
symposium held April 14-16, 2009, San Francisco, california, U.S.A.
Edición de la obra CMOS gate-stack scaling-- materials, interfaces and reliability implications
| Autor | Alexander A. Demkov |
|---|---|
| Editorial | Materials Research Society |
| Fecha de publicación | 2009 |
| Lugar | Warrendale, Pa |
| Idioma | inglés |
| Páginas | 179 |
| ISBN-13 | 9781605111285 |
| ISBN-10 | 1605111287 |
| OCLC | 505804375 |
| LCCN | 2011294341 |