Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces (NanoScience and Technology)
Edición de la obra Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
| Autor | G. Kaupp |
|---|---|
| Editorial | Springer |
| Fecha de publicación | September 15, 2006 |
| Idioma | inglés |
| Páginas | 292 |
| Formato | Hardcover |
| ISBN-13 | 9783540284055 |
| ISBN-10 | 3540284052 |
| OCLC | 71008043 |
| LCCN | 2006923691 |