Applications and Metrology at Nanometer-Scale 2
Measurement Systems, Quantum Engineering and RBDO Method
Edición de la obra Applications and Metrology at Nanometer-Scale 2
| Autor | Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
|---|---|
| Editorial | Wiley & Sons, Incorporated, John |
| Fecha de publicación | 2021 |
| Idioma | inglés |
| ISBN-13 | 9781119818977 |
| Número de Cutter | D131a |