Advances in surface and thin film diffraction
symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
Edición de la obra Advances in Surface and Thin Film Diffraction
| Autor | Philip J. Cohen, David J. Eaglesham, Ting C. Huang |
|---|---|
| Editorial | Materials Research Society |
| Fecha de publicación | 1991 |
| Lugar | Pittsburgh, Pa |
| Idioma | inglés |
| Páginas | 367 |
| ISBN-10 | 155899100X |
| OCLC | 23253737 |
| LCCN |