Advances in Scanning Probe Microscopy
Edición de la obra Advances in scanning probe microscopy
| Autor | T. Sakurai, Y. Watanabe |
|---|---|
| Editorial | Springer Berlin / Heidelberg |
| Fecha de publicación | 2012 |
| Idioma | inglés |
| Páginas | 343 |
| ISBN-13 | 9783642630842 |
| Número de Cutter | S158a |
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.