Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Edición de la obra Advanced Scanning Electron Microscopy and X-Ray Microanalysis
| Autor | Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury |
|---|---|
| Editorial | Springer US |
Edición de la obra Advanced Scanning Electron Microscopy and X-Ray Microanalysis
| Autor | Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury |
|---|---|
| Editorial | Springer US |
| Fecha de publicación |
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| 1986 |
| Lugar | Boston, MA |
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| Idioma | alemán |
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| Formato | Elektronische Ressource |
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| ISBN-13 | 9781475790276 |
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| ISBN-10 | 1475790279 |
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| OCLC | 860358579 |
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| Número de Cutter | E18a |
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