Advanced materials and devices for sensing and imaging
17-18 October 2002, Shanghai, China
Edición de la obra Advanced materials and devices for sensing and imaging
| Autor | Jianquan Yao |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 2002 |
| Lugar | Bellingham, Wash., USA |
| Idioma | inglés |
| Páginas | 548 |
| ISBN-10 | 0819447080 |
| OCLC | 50904471 |
| LCCN | 2003265089 |
| Serie | SPIE proceedings series, · v. 4919 · Proceedings of SPIE--the International Society for Optical Engineering ; |
| Número de Cutter |