Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2-4 August, 2005, San Diego, California, USA
Edición de la obra Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
| Autor | SPIE |
|---|---|
| Editorial | SPIE-International Society for Optical Engine |
| Fecha de publicación | January 2005 |
| Idioma | inglés |
| Páginas | 1 |
| Formato | Paperback |
| ISBN-13 | 9780819458834 |
| ISBN-10 | 081945883X |
| LCCN | 2005284407 |
| Número de Cutter | S755a |