2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada
Proceedings
Edición de la obra 2000 IEEE International Workshop on Defect Based Testing
| Autor | Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal |
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| Editorial | Institute of Electrical & Electronics Enginee |