Ulrike Grossner · 13 obras en el catálogoObrasFFunctional and Eco-Friendly MaterialsFunctional and Eco-Friendly MaterialsSSilicon Carbide MOSFETs and Special MaterialsSilicon Carbide MOSFETs and Special MaterialsFFunctional Materials and Materials ReliabilityFunctional Materials and Materials ReliabilitySSilicon Carbide Wafer Manufacturing, Optoelectronic and ElecSilicon Carbide Wafer Manufacturing, Optoelectronic and Electronic Devices and TechnologiesEEngineering Materials, Devices and EquipmentsEngineering Materials, Devices and EquipmentsTTechnologies and Application of Engineering MaterialsTechnologies and Application of Engineering MaterialsIInternational Conference on Silicon Carbide and Related MateInternational Conference on Silicon Carbide and Related Materials ICSCRM 2022SSilicon Carbide and Advanced MaterialsSilicon Carbide and Advanced MaterialsSSemiconductor Wafer Fabrication, Coatings and TribologySemiconductor Wafer Fabrication, Coatings and TribologyMManufacturing and Properties of Functional MaterialsManufacturing and Properties of Functional MaterialsDDefects and Synchrotron X-Ray Topography in Silicone-CarbideDefects and Synchrotron X-Ray Topography in Silicone-Carbide Based DevicesOOptical, Electronic and Special MaterialsOptical, Electronic and Special MaterialsAAdvanced Engineering MaterialsAdvanced Engineering Materials
SSilicon Carbide Wafer Manufacturing, Optoelectronic and ElecSilicon Carbide Wafer Manufacturing, Optoelectronic and Electronic Devices and Technologies
TTechnologies and Application of Engineering MaterialsTechnologies and Application of Engineering Materials
IInternational Conference on Silicon Carbide and Related MateInternational Conference on Silicon Carbide and Related Materials ICSCRM 2022
SSemiconductor Wafer Fabrication, Coatings and TribologySemiconductor Wafer Fabrication, Coatings and Tribology
MManufacturing and Properties of Functional MaterialsManufacturing and Properties of Functional Materials
DDefects and Synchrotron X-Ray Topography in Silicone-CarbideDefects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices